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Regression modeling for digital test of ΣΔ modulators

 

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Author: Léger, Gildas
Rueda Rueda, Adoración
Department: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Date: 2010
Published in: XXV Conference on Design of Circuits and Integrated Systems (2010), p 1-6
Document type: Presentation
Abstract: The cost of Analogue and Mixed-Signal circuit testing is an important bottleneck in the industry, due to timeconsuming verification of specifications that require state-ofthe- art Automatic Test Equipment. In this paper, we apply the concept of Alternate Test to achieve digital testing of converters. By training an ensemble of regression models that maps simple digital defect-oriented signatures onto Signal to Noise and Distortion Ratio (SNDR), an average error of 1:7% is achieved. Beyond the inference of functional metrics, we show that the approach can provide interesting diagnosis information.
Cite: Léger, G. y Rueda Rueda, A. (2010). Regression modeling for digital test of ΣΔ modulators. En XXV Conference on Design of Circuits and Integrated Systems, Lanzarote del 17 al 19 de noviembre de 2010.
Size: 161.1Kb
Format: PDF

URI: https://hdl.handle.net/11441/77379

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