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Estudio comparativo de técnicas de preparación de muestras para microscopía electrónica de transmisión de recubrimientos cerámicos proyectados por plasma

 

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Opened Access Estudio comparativo de técnicas de preparación de muestras para microscopía electrónica de transmisión de recubrimientos cerámicos proyectados por plasma
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Título alternativo: Comparative study of TEM sample preparation techniques for plasma-sprayed ceramic coatings
Author: Ramírez de Arellano López, Antonio
Chiou, W-A.
Faber, K. T.
Department: Universidad de Sevilla. Departamento de Física de la Materia Condensada
Date: 2000
Published in: Boletín de la Sociedad Española de Cerámica y Vidrio, 39(6), 735-740
Document type: Article
Abstract: El desarrollo de materiales avanzados, con microestructuras cada vez más complejas, supone un reto constante de desarrollo y aplicación de técnicas que permitan el análisis de la microestructura de forma eficiente. En el caso de los recubrimientos ...
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The development of advanced materials, with complex microstructures, is a permanent challenge to the development and application of new efficient techniques for microstructural characterization. In ceramic coatings on metals, there exist a differential ion-milling ratio between both components, limiting in principle the use of conventional techniques. In this work, we report on a comparative study of TEM sample preparation techniques for plasma-sprayed ceramic coatings. Firstly, we have used a procedure derived from the conventional one (polishing, dimpling, ion milling), and alternatively a new technique using focused ion-beam milling. The material selected for this study is fine-grained alumina that was plasmasprayed on a steel substrate. The efficiency of both techniques is discussed along with the most significant microstructural features of the material subject of study.
Size: 2.092Mb
Format: PDF

URI: http://hdl.handle.net/11441/23394

DOI: 10.3989/cyv.2000.v39.i6.774

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This work is under a Creative Commons License: 
Attribution-NonCommercial-NoDerivatives 4.0 Internacional

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