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Artículo
Signal Sampling Based Transition Modeling for Digital Gates Characterization
(Springer, 2004)
Current characterization methods introduce an important error in the measurement process. In this paper, we present a novel method to drive the timing characterization of logic gates under variable input transition times. ...
Artículo
Characterization of Normal Propagation Delay for Delay Degradation Model (DDM)
(Springer, 2002-08-27)
In previous papers we have presented a very accurate model that handles the generation and propagation of glitches, which makes an important headway in logic timing simulation. This model is called Delay Degradation Model ...
Artículo
Monolithic integration of Giant Magnetoresistance (GMR) devices onto standard processed CMOS dies
(Elsevier, 2014)
Giant Magnetoresistance (GMR) based technology is nowadays the preferred option for low magnetic fields sensing in disciplines such as biotechnology or microelectronics. Their compatibility with standard CMOS processes is ...