ListarPonencias (Ingeniería y Ciencia de los Materiales y del Transporte) por materia "Transmission electron microscopy"
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Ponencia
Compositional characterization of SiC-SiO2 interfaces in MOSFETs
(The Royal Microscopical Society, 2012)In the context of the MobiSiC project (Mobility engineering for SiC devices) we study 4H-SiC MOSFETs with the aim to get ...