Buscar
Mostrando ítems 1-1 de 1
Artículo
A CMOS Digital SiPM With Focal-Plane Light-Spot Statistics for DOI Computation
(Institute of Electrical and Electronics Engineers, 2017)
Silicon photomultipliers can be used to infer the depth-of-interaction (DOI) in scintillator crystals. DOI can help to improve the quality of the positron emission tomography images affected by the parallax error. This ...