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Listar por autor "Schamm-Chardon, Sylvie"
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Ponencia
Compositional characterization of SiC-SiO2 interfaces in MOSFETs
Beltrán, Ana M.; Schamm-Chardon, Sylvie; Mortet, Vincent; Bedel-Pereira, Eléna; Cristiano, Fuccio; Strenger, C.; Bauer, A.J. (The Royal Microscopical Society, 2012)In the context of the MobiSiC project (Mobility engineering for SiC devices) we study 4H-SiC MOSFETs with the aim to get ...
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Ponencia
EFTEM studies on the localization of silicon nanocrystals embedded in SiO2 for nano-devices
Castro, Celia; Andreozzi, A.; Benassayag, G.; Beltrán, Ana M.; Seguini, G.; Perego, M.; Schamm-Chardon, Sylvie (The Royal Microscopical Society, 2012)We investigated for the first time the capabilities of combining Si NCs fabrication methods like e-beam evaporation and ULE-IBS with block copolymers nanostructured masks.
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Ponencia
MS-3-P-5702 Nanoanalytical investigations at the interface of 4H-SiC/SiO2 MOSFETs [Póster]
Tan, H.; Beltrán, Ana M.; March, K.; Mortet, Vincent; Bedel-Pereira, Eléna; Cristiano, Fuccio; Strenger, C.; Bauer, A.J.; Schamm-Chardon, Sylvie (Czechoslovak Microscopy Society, 2014)