Quasi-TEM analysis of multilayered, multiconductor coplanar structures with dielectric and magnetic anisotropy including substrate losses

Abstract

A quasi-TEM (transverse electromagnetic) analysis of multiconductor planar lines embedded in a layered structure involving lossy iso/anisotropic electric and/or magnetic materials is achieved. Conditions under which a quasi-TEM assumption is valid are theoretically determined. An efficient spectral-domain analysis is used to determine the complex capacitance and inductance matrices characterizing the transmission system. computation of the inductance matrix is reduced to the computation of an equivalent capacitance matrix when media characterized for a fully general permeability tensor are present. It is also shown that most actual monolithic microwave integrated circuit (MMIC) microstrip-type structures (where semiconductor substrates are present) and possible future applications including lossy magnetic materials can be analyzed by using the simple quasi-TEM model. The validity of the results has been verified by comparison with full-wave theoretical and experimental data on microstrip lines on magnetic substrates and slow-wave structures