dc.creator | Reyneri, Leonardo Maria | es |
dc.creator | Serrano Cases, Alejandro | es |
dc.creator | Morilla García, Yolanda | es |
dc.creator | Cuenca Asensi, Sergio | es |
dc.creator | Martínez Álvarez, Antonio | es |
dc.date.accessioned | 2019-08-22T10:55:06Z | |
dc.date.available | 2019-08-22T10:55:06Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | Reyneri, L.M., Serrano Cases, A., Morilla García, Y., Cuenca Asensi, S. y Martínez Álvarez, A. (2019). A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments. Electronics, 8 (6), 653. | |
dc.identifier.issn | 2079-9292 | es |
dc.identifier.uri | https://hdl.handle.net/11441/88585 | |
dc.description.abstract | A high-level C++ hardening library is designed for the protection of critical software
against the harmful effects of radiation environments that can damage systems. A mathematical
and empirical model to predict system behavior in the presence of radiation induced faults is
also presented. This model generates a quick evaluation and adjustment of several reliability vs.
performance trade-offs, to optimize radiation hardening based on the proposed C++ hardening
library. Several simulations and irradiation campaigns with protons and neutrons are used to build
the model and to tune it. Finally, the effects of our hardening approach are compared with other
hardened and non-hardened approaches. | es |
dc.description.sponsorship | MINECO / FEDER, UE-ESP2015-68245-C4-3-P y ESP2015-68245-C4-4-P | |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | MDPI | es |
dc.relation.ispartof | Electronics, 8 (6), 653. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | fault tolerance | es |
dc.subject | single event upset | es |
dc.subject | proton irradiation effects | es |
dc.subject | neutron irradiation effects | es |
dc.subject | soft errors | es |
dc.title | A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/publishedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Centro Nacional de Aceleradores | es |
dc.relation.projectID | ESP2015-68245-C4-3-P | |
dc.relation.projectID | ESP2015-68245-C4-4-P | |
dc.relation.publisherversion | https://doi.org/10.3390/electronics8060653 | es |
dc.identifier.doi | 10.3390/electronics8060653 | es |
idus.format.extent | 13 p. | es |
dc.journaltitle | Electronics | es |
dc.publication.volumen | 8 | es |
dc.publication.issue | 6 | es |
dc.publication.initialPage | 653 | es |