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dc.creatorReyneri, Leonardo Mariaes
dc.creatorSerrano Cases, Alejandroes
dc.creatorMorilla García, Yolandaes
dc.creatorCuenca Asensi, Sergioes
dc.creatorMartínez Álvarez, Antonioes
dc.date.accessioned2019-08-22T10:55:06Z
dc.date.available2019-08-22T10:55:06Z
dc.date.issued2019
dc.identifier.citationReyneri, L.M., Serrano Cases, A., Morilla García, Y., Cuenca Asensi, S. y Martínez Álvarez, A. (2019). A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments. Electronics, 8 (6), 653.
dc.identifier.issn2079-9292es
dc.identifier.urihttps://hdl.handle.net/11441/88585
dc.description.abstractA high-level C++ hardening library is designed for the protection of critical software against the harmful effects of radiation environments that can damage systems. A mathematical and empirical model to predict system behavior in the presence of radiation induced faults is also presented. This model generates a quick evaluation and adjustment of several reliability vs. performance trade-offs, to optimize radiation hardening based on the proposed C++ hardening library. Several simulations and irradiation campaigns with protons and neutrons are used to build the model and to tune it. Finally, the effects of our hardening approach are compared with other hardened and non-hardened approaches.es
dc.description.sponsorshipMINECO / FEDER, UE-ESP2015-68245-C4-3-P y ESP2015-68245-C4-4-P
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherMDPIes
dc.relation.ispartofElectronics, 8 (6), 653.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectfault tolerancees
dc.subjectsingle event upsetes
dc.subjectproton irradiation effectses
dc.subjectneutron irradiation effectses
dc.subjectsoft errorses
dc.titleA Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environmentses
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/publishedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Centro Nacional de Aceleradoreses
dc.relation.projectIDESP2015-68245-C4-3-P
dc.relation.projectIDESP2015-68245-C4-4-P
dc.relation.publisherversionhttps://doi.org/10.3390/electronics8060653es
dc.identifier.doi10.3390/electronics8060653es
idus.format.extent13 p.es
dc.journaltitleElectronicses
dc.publication.volumen8es
dc.publication.issue6es
dc.publication.initialPage653es

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