Artículo
A general perspective of the characterization and quantification of nanoparticles: Imaging, spectroscopic, and separation techniques
Autor/es | Lapresta Fernández, A.
Salinas Castillo, A. Anderson de la LLana, S. Costa Fernández, J.M. Domínguez Meister, Santiago Cecchini, R. Capitán Vallvey, L. F. Moreno Bondi, M.C. Marco, María Pilar Sánchez López, J.C. Anderson, I.S. |
Fecha de publicación | 2014 |
Fecha de depósito | 2018-12-19 |
Publicado en |
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Resumen | This article gives an overview of the different techniques used to identify, characterize, and quantify engineered nanoparticles (ENPs). The state-of-the-art of the field is summarized, and the different characterization ... This article gives an overview of the different techniques used to identify, characterize, and quantify engineered nanoparticles (ENPs). The state-of-the-art of the field is summarized, and the different characterization techniques have been grouped according to the information they can provide. In addition, some selected applications are highlighted for each technique. The classification of the techniques has been carried out according to the main physical and chemical properties of the nanoparticles such as morphology, size, polydispersity characteristics, structural information, and elemental composition. Microscopy techniques including optical, electron and X-ray microscopy, and separation techniques with and without hyphenated detection systems are discussed. For each of these groups, a brief description of the techniques, specific features, and concepts, as well as several examples, are described. |
Agencias financiadoras | Junta de Andalucía |
Identificador del proyecto | FQM-5974
CEI2013- MP-10 |
Cita | Lapresta Fernández, A., Salinas Castillo, A., Anderson de la LLana, S., Costa Fernández, J.M., Domínguez Meister, S., Cecchini, R.,...,Anderson, I.S. (2014). A general perspective of the characterization and quantification of nanoparticles: Imaging, spectroscopic, and separation techniques. Critical Reviews in Solid State and Materials Sciences, 39, 423-458. |
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