Artículo
On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation
Autor/es | Martin, Honorio
Martin-Holgado, Pedro Peris-Lopez, Pedro Morilla García, Yolanda Entrena, Luis |
Departamento | Universidad de Sevilla-CSIC. Centro Nacional de Aceleradores |
Fecha de publicación | 2018 |
Fecha de depósito | 2018-09-26 |
Publicado en |
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Resumen | The effects of ionizing radiation on field-programmable gate arrays (FPGAs) have been
investigated in depth during the last decades. The impact of these effects is typically evaluated on
implementations which have a ... The effects of ionizing radiation on field-programmable gate arrays (FPGAs) have been investigated in depth during the last decades. The impact of these effects is typically evaluated on implementations which have a deterministic behavior. In this article, two well-known true-random number generators (TRNGs) based on sampling jittery signals have been exposed to a Co-60 radiation source as in the standard tests for space conditions. The effects of the accumulated dose on these TRNGs, an in particular, its repercussion over their randomness quality (e.g., entropy or linear complexity), have been evaluated by using two National Institute of Standards and Technology (NIST) statistical test suites. The obtained results clearly show how the degradation of the statistical properties of these TRNGs increases with the accumulated dose. It is also notable that the deterioration of the TRNG (non-deterministic component) appears before that the degradation of the deterministic elements in the FPGA, which compromises the integrated circuit lifetime. |
Identificador del proyecto | ESP-2015-68245-C4-1-P
ESP-2015-68245-C4-4-P TIN2016-79095-C2-2-R S2013/ICE-3095 |
Cita | Martin, H., Martin-Holgado, P., Peris-Lopez, P., Morilla García, Y. y Entrena, L. (2018). On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation. Entropy, 20, 513. |
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entropy-20-00513.pdf | 2.994Mb | [PDF] | Ver/ | |