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dc.creatorYanguas Gil, Alejandroes
dc.creatorCotrino Bautista, Josées
dc.creatorWalkiewicz-Pietrzykowska, A.es
dc.creatorRodríguez González-Elipe, Agustínes
dc.date.accessioned2017-04-27T09:28:18Z
dc.date.available2017-04-27T09:28:18Z
dc.date.issued2007
dc.identifier.citationYanguas Gil, A., Cotrino Bautista, J., Walkiewicz-Pietrzykowska, A. y Rodríguez González-Elipe, A. (2007). Scaling behavior and mechanism of formation of Si O2 thin films grown by plasma-enhanced chemical vapor deposition. Physical Review B - Condensed Matter and Materials Physics, 76 (7), 075314-.
dc.identifier.issn1098-0121es
dc.identifier.urihttp://hdl.handle.net/11441/58723
dc.description.abstractThis paper reports a study of the kinetic roughening of Si O2 thin films prepared by plasma-enhanced chemical vapor deposition (PECVD). Tetramethylsilane has been used as a precursor, and the synthesis has been carried out under remote and in-plasma configurations. The analysis of surface topography of the films by atomic force microscopy shows an anomalous scaling behavior that cannot be represented by the Family-Vicsec scaling relation of dynamic scaling theory. The application of different methods for obtaining the roughness exponent α yields different values of this exponent (α=0.7 for the height-height correlation function and α=1.3 for the power spectral density function for long deposition times) in all experimental conditions. Moreover, a strong variation of the α exponent with deposition time has been determined for the samples grown in remote mode. This correlates with the presence of a crossover region of the growth exponent β, which varies from a first value of 1.3 for low deposition times to another of 0.3 for longer deposition times. Such a variation is not found for the samples grown in the plasma, characterized by a β value of 0.28. The results obtained can be explained by the combined effect in the growth process of a low diffusivity of the physisorbed species along with the existence of nonlocal interactions due to shadowing effects. These two assumptions are in agreement with the empirical knowledge existing about the kinetics of the growth of Si O2 thin films by PECVD and establish a link between the scaling properties of the films with the surface chemistry during the film growth.es
dc.description.sponsorshipMinisterio de Educación y Ciencia MAT2004-01558 y MAT2007-65764es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherAmerican Physical Societyes
dc.relation.ispartofPhysical Review B - Condensed Matter and Materials Physics, 76 (7), 075314-.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleScaling behavior and mechanism of formation of Si O2 thin films grown by plasma-enhanced chemical vapor depositiones
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/publishedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Física Atómica, Molecular y Nucleares
dc.relation.projectIDMAT2004-01558es
dc.relation.projectIDMAT2007-65764es
dc.relation.publisherversion10.1103/PhysRevB.76.075314es
dc.identifier.doihttp://dx.doi.org/10.1103/PhysRevB.76.075314es
idus.format.extent8 p.es
dc.journaltitlePhysical Review B - Condensed Matter and Materials Physicses
dc.publication.volumen76es
dc.publication.issue7es
dc.publication.initialPage075314es
dc.contributor.funderMinisterio de Educación y Ciencia (MEC). España

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