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dc.creatorFrutos Rayego, Fabián
dc.creatorAcedo García, Miguel
dc.creatorJadraque Alonso, Antonio
dc.creatorMudarra, M.
dc.creatorSellarés, J.
dc.creatorBelana, J.
dc.date.accessioned2016-02-08T06:43:14Z
dc.date.available2016-02-08T06:43:14Z
dc.date.issued2004
dc.identifier.isbn0-7803-8348-6es
dc.identifier.urihttp://hdl.handle.net/11441/34242
dc.description.abstractIt is well established that space charge conditions insulation lifetime. Because of this, space charge formation and relaxation processes characterization has become a very active research field, not only from an basic science point of view, but also in order to improve insulation performance in cable and other devices. In the case of mid-voltage power cable, crosslinked polyethylene is widely used as insulator. Service temperature of such cables is around 90°C, which in the case of the cable insulation studied is in the melting temperature range. In previous works it has been determined that at this temperature conductivity plays a relevant role in the space charge relaxation process, so that the characterization of conductive processes at service temperature may become important in order to enhance cable insulation performance. The aim of this work is to contribute to a better knowledge of the conductive properties of XLPE in both time and frequency domains.es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherIEEEes
dc.relation.ispartof2004 International Conference on Solid Dielectrics (1), 119-122, Toulouse, France, July 5-9, 2004es
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleComparative Study of Conductivity in Mid-Voltage Cable XLPE Insulationes
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/publishedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Física Aplicada Ies
dc.relation.publisherversionhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1350304es
dc.identifier.doihttp://dx.doi.org/10.1109/ICSD.2004.1350304es
dc.identifier.idushttps://idus.us.es/xmlui/handle/11441/34242

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