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dc.creatorPerdigones Sánchez, Francisco
dc.creatorMoreno López, José Manuel
dc.creatorLuque Estepa, Antonio
dc.creatorQuero Reboul, José Manuel
dc.date.accessioned2015-09-01T10:18:23Z
dc.date.available2015-09-01T10:18:23Z
dc.date.issued2010
dc.identifier.issn1750-0443es
dc.identifier.urihttp://hdl.handle.net/11441/28116
dc.description.abstractThe characterisation of the fabrication process to develop freestanding SU-8 structures integrated in printing circuit board in microelectromechanical systems (PCBMEMS) technology is presented. SU-8 microcantilevers, microbridges, microchannels and micromembranes have been fabricated following the described procedure. Adherence between FR4 substrate and SU-8 has been examined using the destructive blister method, evaluating the surface energy. Residual thermal stress has also been analysed for this integration and compared when using other substrates. Moreover, an estimation of the copper wet etching with cupric chloride has been performed in order to understand how this isotropic etching affects the geometry of the copper structures. Finally, stiction has been observed and examined, estimating the adhesion energy responsible for this effect.es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherThe Institution of Engineering and Technologyes
dc.relation.ispartofMicro & Nano Letters, 5(1), 7-13es
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectFabrication processes
dc.subjectfreestanding SU-8es
dc.subjectPCBMEMSes
dc.titleCharacterisation of the fabrication process of freestanding SU-8 microstructures integrated in printing circuit board in microelectromechanical systemses
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Ingeniería Electrónicaes
dc.relation.publisherversion10.1049/mnl.2009.0097es
dc.relation.publisherversionhttp://dx.doi.org/10.1049/mnl.2009.0097
dc.identifier.doi10.1049/mnl.2009.0097
dc.identifier.idushttps://idus.us.es/xmlui/handle/11441/28116

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