dc.creator | Nápoles Luengo, Javier | es |
dc.creator | Guzmán-Miranda, Hipólito | es |
dc.creator | Aguirre Echanove, Miguel Ángel | es |
dc.creator | Tombs, J. N. | |
dc.creator | Muñoz Chavero, Fernando | es |
dc.creator | Baena Lecuyer, Vicente | es |
dc.creator | Torralba Silgado, Antonio Jesús | es |
dc.creator | García Franquelo, Leopoldo | es |
dc.date.accessioned | 2015-03-26T08:28:28Z | |
dc.date.available | 2015-03-26T08:28:28Z | |
dc.date.issued | 2007 | es |
dc.identifier.citation | Nápoles Luengo, J., Guzmán-Miranda, H., Aguirre Echanove, M.Á., Tombs, J.N., Muñoz Chavero, F., Baena Lecuyer, V.,...,García Franquelo, L. (2007). Radiation environment emulation for VLSI designs: a low cost platform based on xilinx FPGA's. IEEE. | |
dc.identifier.isbn | 978-1-4244-0754-5 | |
dc.identifier.uri | http://hdl.handle.net/11441/23587 | |
dc.description.abstract | As technology shrinks, critical industral applications have to be designed with special care. VLSI circuits become more sensitive to ambient radiation: it affects to the internal structures, combinational or sequential elements. The effects, known as Single Event Effects (SEEs), are modeled as spontaneous logical changes in a running netlist. They can be mitigated at netlist design level by means of inserting massive redundancy logic in the IC memory elements, as well as designing robust deadlock-free state machines. Current techniques for the analysis and verification of the protection logic for VLSI are inefficient and expensive, lacking either speed or analysis. This paper presents the FT-UNSHADES system. This system is a low cost emulator focused on bit-flip insertion and SEE analysis at hardware speed, based on a Xilinx Virtex-II. Radiation tests are emulated in a highly controlled process, using a non-intrusive method. As a result the system can insert and analyse at least 80K faults per hour in a system with 2 million test vectors. | en |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | IEEE | en |
dc.relation.ispartof | International Symposium On Industrial Electronics (ISIE 2007), 3334 - 3338. Vigo, España : IEEE | es |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | es |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | es |
dc.subject | Fault Tolerant | en |
dc.subject | FPGA | en |
dc.subject | Radiation | en |
dc.subject | Partial Reconfiguration | en |
dc.subject | Reliability | en |
dc.subject | VLSI design | en |
dc.title | Radiation environment emulation for VLSI designs: a low cost platform based on xilinx FPGA's | en |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Ingeniería Electrónica | es |
dc.relation.publisherversion | 10.1109/ISIE.2007.4375150 | |
dc.identifier.idus | https://idus.us.es/xmlui/handle/11441/23587 | |