dc.creator | Heras, Irene | es |
dc.creator | Guillén Guillén, Elena | es |
dc.creator | Krause, Matthias | es |
dc.creator | Wenisch, Robert | es |
dc.creator | Escobar-Galindo, Ramón | es |
dc.creator | Endrino, José Luis | es |
dc.date.accessioned | 2023-06-15T08:40:34Z | |
dc.date.available | 2023-06-15T08:40:34Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Heras, I., Guillén Guillén, E., Krause, M., Wenisch, R., Escobar-Galindo, R. y Endrino, J.L. (2014). Comprehensive environmental testing of optical properties in thin films. En 3rd International Conference in Through-life Engineering Services (TESConf 2014) (271-276), ScienceDirect. | |
dc.identifier.issn | 2212-8271 (online) | es |
dc.identifier.uri | https://hdl.handle.net/11441/147232 | |
dc.description.abstract | Environmental characterization of optical and structural properties of thin films continues to be a challenging task. To understand the failure
mechanism in high temperature thin film applications, it is crucial to understand how material properties change with temperature. An accurate
knowledge of the variation of the dielectric function of thin films and its relation to compositional and microstructural changes could help to
prevent failures. This article presents an environmental in-situ characterization methodology that combines the study of the optical constants in
an environmental chamber by spectroscopic ellipsometry, with compositional depth profile analysis using ion beam analysis techniques and a
structure analysis by Raman spectroscopy. The main novelty of this methodology is that all analytical techniques are carried out sequentially in
a multi-chamber cluster tool without sample exposure to undefined atmospheres. Carbon-titanium metal thin film had been studied following
the described characterization methodology | es |
dc.format | application/pdf | es |
dc.format.extent | 6 | es |
dc.language.iso | eng | es |
dc.publisher | ScienceDirect | es |
dc.relation.ispartof | 3rd International Conference in Through-life Engineering Services (TESConf 2014) (2014), pp. 271-276. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | Thin films | es |
dc.subject | optical constants | es |
dc.subject | cluster tool | es |
dc.subject | high temperature applications | es |
dc.subject | thermal degradation | es |
dc.subject | real time spectroscopic ellipsometry | es |
dc.subject | ion beam analysis | es |
dc.subject | Raman spectroscopy | es |
dc.title | Comprehensive environmental testing of optical properties in thin films | es |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/publishedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Física Aplicada I | es |
dc.relation.publisherversion | https://www.sciencedirect.com/science/article/pii/S2212827114008087 | es |
dc.identifier.doi | 10.1016/j.procir.2014.06.153 | es |
dc.publication.initialPage | 271 | es |
dc.publication.endPage | 276 | es |
dc.eventtitle | 3rd International Conference in Through-life Engineering Services (TESConf 2014) | es |