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dc.creatorLiu, Shichaoes
dc.creatorWu, Liganges
dc.creatorLeón Galván, José Ignacioes
dc.creatorChen, Boes
dc.date.accessioned2022-09-01T17:20:41Z
dc.date.available2022-09-01T17:20:41Z
dc.date.issued2022-02
dc.identifier.citationLiu, S., Wu, L., León, J.I. y Chen, B. (2022). Guest editorial: Machine learning for secure cyber-physical industrial control systems. IET Cyber‐Physical Systems: Theory & Applications, 7 (1), 1-3.
dc.identifier.issn2398-3396es
dc.identifier.urihttps://hdl.handle.net/11441/136615
dc.formatapplication/pdfes
dc.format.extent3 p.es
dc.language.isoenges
dc.publisherWiley-IET The Institution of Engineering and Technologyes
dc.relation.ispartofIET Cyber‐Physical Systems: Theory & Applications, 7 (1), 1-3.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleGuest editorial: Machine learning for secure cyber-physical industrial control systems [Editorial]es
dc.typeinfo:eu-repo/semantics/articlees
dc.type.versioninfo:eu-repo/semantics/publishedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Ingeniería Electrónicaes
dc.relation.publisherversionhttps://ietresearch.onlinelibrary.wiley.com/doi/10.1049/cps2.12029es
dc.identifier.doi10.1049/cps2.12029es
dc.journaltitleIET Cyber‐Physical Systems: Theory & Applicationses
dc.publication.volumen7es
dc.publication.issue1es
dc.publication.initialPage1es
dc.publication.endPage3es

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