dc.creator | Zhang, Yingjie | es |
dc.creator | Kang, Jun | es |
dc.creator | Pluchery, Olivier | es |
dc.creator | Caillard, Louis | es |
dc.creator | Chabal, Yves J. | es |
dc.creator | Wang, Lin-Wang | es |
dc.creator | Fernández Sanz, Javier | es |
dc.creator | Salmeron, Miquel | es |
dc.date.accessioned | 2022-06-01T15:43:43Z | |
dc.date.available | 2022-06-01T15:43:43Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | Zhang, Y., Kang, J., Pluchery, O., Caillard, L., Chabal, Y.J., Wang, L.,...,Salmeron, M. (2019). Nanoimaging of Organic Charge Retention Effects: Implications for Nonvolatile Memory, Neuromorphic Computing, and High Dielectric Breakdown Devices. ACS Applied Nano Materials, 2 (8), 4711-4716. | |
dc.identifier.issn | 2574-0970 | es |
dc.identifier.uri | https://hdl.handle.net/11441/133937 | |
dc.description.abstract | While a large variety of organic and molecular materials have been found to exhibit charge memory effects, the underlying mechanism is not well-understood, which hinders rational device design. Here, we study the charge retention mechanism of a nanoscale memory system, an organic monolayer on a silicon substrate, with Au nanoparticles on top serving as the electrical contact. Combining scanning probe imaging/manipulation and density functional simulations, we observe stable charge retention effects in the system and attributed it to polaron effects at the amine functional groups. Our findings can pave the way for applications in nonvolatile memory, neuromorphic computing, and high dielectric breakdown devices. | es |
dc.description.sponsorship | U.S. Department of Energy DE-AC02-05CH11231 | es |
dc.description.sponsorship | U.S. National Science Foundation CHE-1300180 | es |
dc.description.sponsorship | Marie Curie FP7 ILSES 612620 | es |
dc.description.sponsorship | Nanotwinning FP7 NN294952 | es |
dc.format | application/pdf | es |
dc.format.extent | 18 p. | es |
dc.language.iso | eng | es |
dc.publisher | American Chemical Society | es |
dc.relation.ispartof | ACS Applied Nano Materials, 2 (8), 4711-4716. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | Charge retention | es |
dc.subject | Density functional theory | es |
dc.subject | Kelvin probe force microscopy | es |
dc.subject | Nanoparticle | es |
dc.subject | Nonvolatile memory | es |
dc.subject | Organic monolayer | es |
dc.subject | Polaron | es |
dc.title | Nanoimaging of Organic Charge Retention Effects: Implications for Nonvolatile Memory, Neuromorphic Computing, and High Dielectric Breakdown Devices | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/acceptedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Química Física | es |
dc.relation.projectID | DE-AC02-05CH11231 | es |
dc.relation.projectID | CHE-1300180 | es |
dc.relation.projectID | 612620 | es |
dc.relation.projectID | NN294952 | es |
dc.relation.publisherversion | https://doi.org/10.1021/acsanm.9b01182 | es |
dc.identifier.doi | 10.1021/acsanm.9b01182 | es |
dc.journaltitle | ACS Applied Nano Materials | es |
dc.publication.volumen | 2 | es |
dc.publication.issue | 8 | es |
dc.publication.initialPage | 4711 | es |
dc.publication.endPage | 4716 | es |
dc.contributor.funder | Department of Energy. United States | es |
dc.contributor.funder | National Science Foundation (NSF). United States | es |