Artículo
Thin film nanostructuring at oblique angles by substrate patterning
Autor/es | Muñoz-Piña, Sandra
Márquez Alcaide, Antonio José Limones-Ahijón, Blanca Oliva Ramírez, Manuel Rico-Gavira, Víctor Joaquín Alcalá Penadés, Germán González Sagardoy, Maria Ujué García-Martín, José Miguel Álvarez Molina, Rafael Wang, Dong Schaaf, Peter Rodríguez González-Elipe, Agustín Palmero Acebedo, Alberto |
Departamento | Universidad de Sevilla. Departamento de Física Aplicada I Universidad de Sevilla. Departamento de Química Inorgánica |
Fecha de publicación | 2022-04 |
Fecha de depósito | 2022-03-18 |
Publicado en |
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Resumen | It is demonstrated that, besides classical nanocolumnar arrays, the oblique angle geometry induces the growth of singular structures in the nanoscale when using wisely designed patterned substrates. Well-ordered array of ... It is demonstrated that, besides classical nanocolumnar arrays, the oblique angle geometry induces the growth of singular structures in the nanoscale when using wisely designed patterned substrates. Well-ordered array of crosses, cylindrical nanorods or hole structures arranged in square or hexagonal regular geometries are reported as examples, among others. The fundamental framework connecting substrate topography and film growth at oblique angles is presented, allowing the use of substrate patterning as a feasible thin film nanostructuring technique. A systematic analysis of the growth of TiO2 thin films on 4 different lithographic patterned substrates in 4 different scale lengths is also presented. A first conclusion is the existence of a height-based selective growth in the initial stages of the deposition, by which the film preferentially develops on top of the tallest substrate features. This behavior is maintained until the film reaches a critical thickness, the so-called Oblivion Thickness, above which the film topography becomes gradually independent of the substrate features. A general formula relating the spatial features of the pattern, the coarsening exponent and the Oblivion Thickness has been deduced. |
Identificador del proyecto | PID2019-110430GB-C21
PID2020-112620GB-I00 PID2020-114270RA-I00 RTI2018-098117-B-C21 P18-RT-3480 P18-RT-6079 |
Cita | Muñoz-Piña, S., Márquez Alcaide, A.J., Limones-Ahijón, B., Oliva Ramírez, M., Rico-Gavira, V.J., Alcalá Penadés, G.,...,Palmero Acebedo, A. (2022). Thin film nanostructuring at oblique angles by substrate patterning. Surface and Coatings Technology, 436, 128293 |
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SCT_alvarez-molina_2022_thin.pdf | 8.747Mb | [PDF] | Ver/ | |