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dc.creatorBenavides Cuevas, David Felipees
dc.creatorGalindo Duarte, José Ángeles
dc.date.accessioned2021-10-22T09:36:19Z
dc.date.available2021-10-22T09:36:19Z
dc.date.issued2018
dc.identifier.citationBenavides Cuevas, D.F. y Galindo Duarte, J.Á. (2018). Automated analysis of feature models: current state and practices. En SPLC 2018: 22nd International Systems and Software Product Line Conference Gothenburg, Sweden: Association for Computing Machinery (ACM).
dc.identifier.isbn978-1-4503-6464-5es
dc.identifier.urihttps://hdl.handle.net/11441/126775
dc.description.abstractSoftware Product Lines (SPLs) are about developing a set of different software products that share some common functionality. Feature models are widely used to encode the common and variant parts of an SPL. The number of products encoded in a feature model grows with the number of features. Given n features and no constraints on valid feature combinations, there are 2n possible products. To deal with this complexity, automated mechanisms are used to extract information from feature models, such as features present in every product. A diversity of operations have been developed to model check, test, configure, debug, or compute relevant information by analyzing feature models. Moreover, such operations have been used in scenarios from different domains ranging from operating systems to video analysis optimization. In this tutorial, we go through the different automated analysis operations identifying its usage in the literature. Later present how to implement these operations within the FaMa framework.es
dc.formatapplication/pdfes
dc.format.extent1es
dc.language.isoenges
dc.publisherAssociation for Computing Machinery (ACM)es
dc.relation.ispartofSPLC 2018: 22nd International Systems and Software Product Line Conference (2018).
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectSPLes
dc.subjectAutomated Analysis of Feature Models (AAFM)es
dc.titleAutomated analysis of feature models: current state and practiceses
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/publishedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticoses
dc.relation.publisherversionhttps://dl.acm.org/doi/abs/10.1145/3233027.3233055es
dc.identifier.doi10.1145/3233027.3233055es
dc.eventtitleSPLC 2018: 22nd International Systems and Software Product Line Conferencees
dc.eventinstitutionGothenburg, Swedenes
dc.relation.publicationplaceNew York, USAes

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