ListarArtículos (Tecnología Electrónica) por materia "Mean time between failures"
Mostrando ítems 1-1 de 1
-
Artículo
Analysis of Metastable Operation in a CMOS Dynamic D-Latch
(Springer, 1997)Nowadays, metastability is becoming a serious problem in high-performance VLSI design, mainly due to the relatively-high ...