Filtrado por: Materia
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360° electron tomography (1) |
Dual-beam SEM/FIB (1) |
Micromanipulation (1) |
Pick and place (1) |
Sample preparation (1) |
360° electron tomography (1) |
Dual-beam SEM/FIB (1) |
Micromanipulation (1) |
Pick and place (1) |
Sample preparation (1) |