ListarArtículos (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) por materia "Design for testability"
Mostrando ítems 1-1 de 1
-
Artículo
Low-cost digital detection of parametric faults in cascaded ΣΔ modulators
(Institute of Electrical and Electronics Engineers, 2009)The test of modulators is cumbersome due to the high performance they reach. Moreover, technology scaling trends raise ...