- idUS
- Investigación
- Ciencias
- Instituto de Microelectrónica de Sevilla (IMSE-CNM)
- Artículos (Instituto de Microelectrónica de Sevilla (IMSE-CNM))
- Listar Artículos (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) por autor
Listar Artículos (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) por autor "Vázquez García de la Vega, Diego"
Mostrando ítems 1-7 de 7
-
Artículo
A BIST solution for frequency domain characterization of analog circuits
Barragán Asián, Manuel José; Vázquez García de la Vega, Diego; Rueda Rueda, Adoración (Springer, 2010)This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It ...
-
Artículo
Analog sinewave signal generators for mixed-signal built-in test applications
Barragán Asián, Manuel José; Vázquez García de la Vega, Diego; Rueda Rueda, Adoración (Springer, 2011)This work presents a technique for the generation of analog sinusoidal signals with high spectral quality and reduced ...
-
Artículo
Energy-Aware Low-Power CMOS LNA with Process-Variations Management
González, Jorge Luis; Luiz Moreno, Robson; Cruz, Juan Carlos; Vázquez García de la Vega, Diego (Hindawi Publishing Corporation, 2016)A reconfigurable low-noise amplifier (LNA) with digitally controllable gain and power consumption is presented.This ...
-
Artículo
On-chip characterization of RF systems based on envelope response analysis
Barragán Asián, Manuel José; Fiorelli, Rafaella; Vázquez García de la Vega, Diego; Rueda Rueda, Adoración; Huertas Díaz, José Luis (Institution of Engineering and Technology, 2010)A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis ...
-
Artículo
On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits
Vázquez García de la Vega, Diego; Huertas Sánchez, Gloria; Léger, Gildas; Peralías Macías, Eduardo; Rueda Rueda, Adoración; Huertas Díaz, José Luis (Springer, 2002)This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the ...
-
Artículo
On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications
Barragán Asián, Manuel José; Léger, Gildas; Vázquez García de la Vega, Diego; Rueda Rueda, Adoración (Springer, 2015)This work presents a technique for the on- chip generation of analog sinusoidal signals with high spectral quality and ...
-
Artículo
Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell
Huertas Sánchez, Gloria; Vázquez García de la Vega, Diego; Peralías Macías, Eduardo; Rueda Rueda, Adoración; Huertas Díaz, José Luis (Institute of Electrical and Electronics Engineers, 2002)A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is ...