ListarInstituto de Microelectrónica de Sevilla (IMSE-CNM) por materia "BIST"
Mostrando ítems 1-1 de 1
-
Artículo
Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators
(Institute of Electrical and Electronics Engineers, 2004)This paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator ...