ListarInstituto de Microelectrónica de Sevilla (IMSE-CNM) por materia "Aging"
Mostrando ítems 1-2 de 2
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Artículo
Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits
(IEEE, 2020)This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS ...
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Artículo
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
(Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-zero and time-dependent variability effects have become important concerns ...