Browsing Artículos (Instituto de Ciencia de Materiales de Sevilla (ICMS) – CIC Cartuja) by Subject "Helium content"
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Article
Simultaneous quantification of light elements in thin films deposited on Si substrates using proton EBS (Elastic Backscattering Spectroscopy)
(Elsevier, 2014)Quantification of light elements content in thin films is an important and difficult issue in many technological fields ...