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Artículo

dc.creatorLi, Chuanes
dc.creatorCabrera, Diegoes
dc.creatorSancho Caparrini, Fernandoes
dc.creatorSánchez, René-Vinicioes
dc.creatorCerrada, Marielaes
dc.creatorOliveira, José Valente dees
dc.date.accessioned2021-04-19T07:35:44Z
dc.date.available2021-04-19T07:35:44Z
dc.date.issued2020
dc.identifier.citationLi, C., Cabrera, D., Sancho Caparrini, F., Sánchez, R., Cerrada, M. y Oliveira, J.V.d. (2020). One-shot fault diagnosis of 3D printers through improved feature space learning. IEEE Transactions on Industrial Electronics
dc.identifier.issn0278-0046es
dc.identifier.urihttps://hdl.handle.net/11441/107272
dc.description.abstractSignal acquisition from mechanical systems working in faulty conditions is normally expensive. As a consequence, supervised learning-based approaches are hardly applicable. To address this problem, a one-shot learning-based approach is proposed for multi-class classification of signals coming from a feature space created only from healthy condition signals and one single sample for each faulty class. First, a transformation mapping between the input signal space and a feature space is learned through a bidirectional generative adversarial network. Next, the identification of different health condition regions in this feature space is carried out by means of a single input signal per fault. The method is applied to three fault diagnosis problems of a 3D printer and outperforms other methods in the literature.es
dc.formatapplication/pdfes
dc.format.extent9es
dc.language.isoenges
dc.publisherIEEE Computer Societyes
dc.relation.ispartofIEEE Transactions on Industrial Electronics
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectDeep learninges
dc.subjectFault diagnosises
dc.subjectOne-shot learninges
dc.subject3D printeres
dc.titleOne-shot fault diagnosis of 3D printers through improved feature space learninges
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/submittedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Ciencias de la Computación e Inteligencia Artificiales
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/9161402es
dc.identifier.doi10.1109/TIE.2020.3013546es
dc.journaltitleIEEE Transactions on Industrial Electronicses

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