ListarArtículos (Física Aplicada I) por materia "Depth profiling"
Mostrando ítems 1-4 de 4
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Comparative depth-profiling analysis of nanometer-metal multilayers by ion-probing techniques
(ScienceDirect, 2009-04)We examine here the depth resolution (interface width) in elemental analysis and depth profiling of complex layer systems ...
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Depth-selective 2D-ACAR studies on low-k dielectric thin films
(ScienceDirect, 2003)Depth-selective 2D-ACAR investigations on ordered mesoporous silica thin films provide direct evidence that para-positronium ...
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Hydrogen and oxygen in-depth evolution during electrochemical hydrogenation/dehydrogenation of Y–Pd thin films analyzed by Glow Discharge Optical Emission Spectroscopy
(ScienceDirect, 2008-07-31)Elemental in-depth analysis of the Y–Pd thin film under hydrogenation/dehydrogenation has been performed by Glow Discharge ...
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Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES
(SpringerLink, 2010-01-09)An increasing amount of effort is currently being directed towards the development of new functionalized nanostructured ...