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- Instituto de Ciencia de Materiales de Sevilla (ICMS) – CIC Cartuja
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Listar Artículos (Instituto de Ciencia de Materiales de Sevilla (ICMS) – CIC Cartuja) por autor "Ferrer Fernández, Francisco Javier"
Mostrando ítems 1-8 de 8
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Artículo
Characterization and Validation of a‑Si Magnetron-Sputtered Thin Films as Solid He Targets with High Stability for Nuclear Reactions
Fortio Godinho, Vanda Cristina; Ferrer Fernández, Francisco Javier; Fernández Martínez, Begoña; Caballero Hernández, Jaime; Gómez Camacho, Joaquín José; Fernández Camacho, Asunción (American Chemical Society, 2016)In this work, we present our magnetron sputtering based methodology to produce amorphous silicon coatings with closed ...
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Microscopic and macroscopic dielectric description of mixed oxide thin films
Ferrer Fernández, Francisco Javier; Yubero Valencia, Francisco; Mejías Romero, José Antonio; García López, Francisco Javier; Rodríguez González-Elipe, Agustín (American Institute of Physics, 2007)Compact Si–Ti–O and Si–Zr–O mixed oxide thin films are studied by optical characterization refractive index, band gap ...
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Microstructural Evolution and Properties of He-charged a-Si Coatings Prepared by Magnetron Sputtering
Fortio Godinho, Vanda Cristina; Caballero Hernández, J.; Lacroix, Bertrand; Ferrer Fernández, Francisco Javier; Jamon, D.; Jiménez de Haro, M. C.; Fernández, A. (Elsevier, 2024)The introduction of porosity in nanomaterials via magnetron sputtering in helium atmospheres is an interesting strategy ...
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Nanostructured Ti thin films by magnetron sputtering at oblique angles
Álvarez Molina, Rafael; García-Martín, José Miguel; García-Valenzuela, Aurelio; Macías Montero, Manuel Jesús; Ferrer Fernández, Francisco Javier; Santiso, José; Cotrino Bautista, José; Rico-Gavira, Víctor Joaquín; Rodríguez González-Elipe, Agustín; Palmero Acebedo, Alberto (Institute of Physics Publishing, 2016)The growth of Ti thin films by the magnetron sputtering technique at oblique angles and at room temperature is analysed ...
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Plasma Assisted Oblique Angle Deposition of Transparent and Conductive in- Plane Anisotropic ITO Thin Films
Parra Barranco, Julián; Sánchez Valencia, Juan Ramón; García García, Francisco Javier; López Santos, Carmen; González-Elipe, Agustín R.; Aparicio Rebollo, Francisco Javier; Rico-Gavira, Víctor Joaquín; Barranco Quero, Ángel; Ferrer Fernández, Francisco Javier; Borrás Martos, Ana Isabel (Electrochemical Society, 2017)Oblique angle deposition (OAD) is a powerful technique for the fabrication of porous nanostructured oxide thin films. OAD ...
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Plasma Assisted Oblique Angle Deposition of Transparent and Conductive in-Plane Anisotropic ITO Thin Films
Parra Barranco, Julián; Sánchez Valencia, Juan Ramón; Aparicio Rebollo, Francisco Javier; Ferrer Fernández, Francisco Javier; García García, Francisco; Rico-Gavira, Víctor Joaquín; López Santos, Carmen; Borrás Martos, Ana Isabel; Rodríguez González-Elipe, Agustín; Barranco Quero, Ángel (Electrochemical Society, 2017)Oblique angle deposition (OAD) is a powerful technique for the fabrication of porous nanostructured oxide thin films. OAD ...
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Simultaneous quantification of light elements in thin films deposited on Si substrates using proton EBS (Elastic Backscattering Spectroscopy)
Ferrer Fernández, Francisco Javier; Alcaire Martín, María; Caballero Hernández, Jaime; García García, Francisco Javier; Gil Rostra, Jorge; Terriza Fernández, Antonia; Fortio Godinho, Vanda Cristina; García López, Francisco Javier; Barranco Quero, Ángel; Fernández Camacho, Asunción (Elsevier, 2014)Quantification of light elements content in thin films is an important and difficult issue in many technological fields ...
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Size and shape of supported zirconia nanoparticles determined by x-ray photoelectron spectroscopy
Yubero Valencia, Francisco; Mansilla Sánchez, Catalina; Ferrer Fernández, Francisco Javier; Holgado Vázquez, Juan Pedro; Rodríguez González-Elipe, Agustín (American Institute of Physics, 2007)The initial stages of growth of zirconia nanoparticles deposited on SiO2, Y2O3, and CeO2 substrates have been studied by ...