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Artículo
Influence of the yttria content on the mechanical properties of Y2O3-ZrO2 thin films prepared by EB-PVD
(ScienceDirect, 2007-08-28)
A mechanical characterization study of the whole range (ZrO2)1−x–(Y2O3)x system is presented for thin film samples. Films have been prepared by Electron Beam Physical Vapour Deposition (EB-PVD) on Si(1 0 0) substrates. The ...