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Mostrando ítems 1-4 de 4
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Artículo
Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Castro Lopez, Rafael; Roca, Elisenda; Martin Martinez, Javier; Rodriguez, Rosana; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (IEEE, 2020)This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS ...
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Artículo
Statistical characterization of time-dependent variability defects using the maximum current fluctuation
Saraza Canflanca, Pablo; Martín Martínez, J.; Castro-López, Rubén; Roca, E.; Rodríguez, R.; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (Institute of Electrical and Electronics Engineers, 2021-06-17)This article presents a new methodology to extract, at a given operation condition, the statistical distribution of the ...
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Artículo
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Díaz Fortuny, Javier; Saraza Canflanca, Pablo; Rodríguez, Rosana; Martín Martínez, Javier; Castro López, Rafael; Roca, Elisenda; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-zero and time-dependent variability effects have become important concerns ...
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Artículo
Unified RTN and BTI statistical compact modeling from a defect-centric perspective
Pedreira, G.; Martín Martínez, Javier; Saraza Canflanca, Pablo; Castro-López, Rubén; Rodríguez, R.; Roca, Elisenda; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-dependent variability effects have become important concerns for analog ...