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      Electronic state characterization of SiOx thin films prepared by evaporation 

      Barranco Quero, Ángel; Yubero Valencia, Francisco; Espinós Manzorro, Juan Pedro; Groening, P.; Rodríguez González-Elipe, Agustín (American Institute of Physics, 2005)
      SiOx thin films with different stoichiometries from SiO1.3 to SiO1.8 have been prepared by evaporation of silicon monoxide ...