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Listar por autor "Eijt, S.W.H."
Mostrando ítems 1-3 de 3
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Artículo
Depth-selective 2D-ACAR studies on low-k dielectric thin films
Eijt, S.W.H.; Veen, A. van; Falub, Claudiu V.; Escobar-Galindo, Ramón; Schut, Henk; Mijnarends, P.E.; Theije, Fremke de; Balkenende, A.R. (ScienceDirect, 2003)Depth-selective 2D-ACAR investigations on ordered mesoporous silica thin films provide direct evidence that para-positronium ...
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Artículo
Positron beam analysis of structurally ordered porosity in mesoporous silica thin films
Veen, A. van; Escobar-Galindo, Ramón; Schut, Henk; Eijt, S.W.H.; Falub, Claudiu V.; Balkenende, A.R.; Theije, Fremke de (ScienceDirect, 2003-09-15)Positron beam techniques have been employed to characterise low-k dielectric silica based films, which have two or three ...
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Artículo
Systematic positron study of hydrophilicity of the internal pore surface in ordered low-k silica thin films
Escobar-Galindo, Ramón; Veen, A. van; Schut, Henk; Eijt, S.W.H.; Falub, Claudiu V.; Balkenende, A.R.; Theije, Fremke de (ScienceDirect, 2003-09-15)Non-destructive Doppler Broadening (DB), Positronium fraction (f-Ps) and Two Dimensional Angular Correlation of Annihilation ...