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Listar por autor "Díaz Fortuny, Javier"
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Artículo
A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI
Díaz Fortuny, Javier; Martín Martínez, Javier; Rodríguez Martínez, Rosana; Castro López, Rafael; Roca Moreno, Elisenda; Fernández Fernández, Francisco Vidal; Aragonès Cervera, Xavier; Barajas Ojeda, Enrique; Mateo Peña, Diego; Nafría Maqueda, Montserrat (Institute of Electrical and Electronics Engineers (IEEE), 2019)Statistical characterization of CMOS transistor variability phenomena in modern nanometer technologies is key for accurate ...
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Artículo
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Díaz Fortuny, Javier; Saraza Canflanca, Pablo; Rodríguez, Rosana; Martín Martínez, Javier; Castro López, Rafael; Roca, Elisenda; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-zero and time-dependent variability effects have become important concerns ...