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High- and low-energy x-ray photoelectron techniques for compositional depth profiles: destructive versus non-destructive methods
Benito, Noelia; Escobar-Galindo, Ramón; Rubio Zuazo, Juan; Castro Castro, Germán Rafael; Palacio Orcajo, Carlos (IOP Science, 2013-01-17)Hard x-ray photoelectron spectroscopy (HAXPES), angle-resolved x-ray photoelectron spectroscopy (ARXPS) and x-ray photoelectron ...