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Listar por autor "Ayerdi, Jon"
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Ponencia
A general approach to Software Product Line testing
Ruiz, Elvira G.; Ayerdi, Jon; Galindo Duarte, José Ángel; Arrieta, Aitor; Sagardui, Goiuria; Benavides Cuevas, David Felipe (Asociación de Ingeniería del Software y Tecnologías de Desarrollo de Software (SISTEDES), 2019)Variability is a central concept in Software Product Lines (SPLs). It has been extensively studied how the SPL paradigm ...
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Artículo
Performance-Driven Metamorphic Testing of Cyber-Physical Systems
Ayerdi, Jon; Valle, Pablo; Segura Rueda, Sergio; Arrieta, Aitor; Sagardui, Goiuria; Arratibel, Maite (IEEE Computer Society, 2022)Cyber-physical systems (CPSs) are a new generation of systems, which integrate software with physical processes. ...
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Ponencia
QoS-aware Metamorphic Testing: An Elevation Case Study
Ayerdi, Jon; Segura Rueda, Sergio; Arrieta, Aitor; Sagardui, Goiuria; Arratibel, Maite (IEEE Computer Society, 2020)Elevators are among the oldest and most widespread transportation systems, yet their complexity increases rapidly to satisfy ...