Presentation
MS-3-P-5702 Nanoanalytical investigations at the interface of 4H-SiC/SiO2 MOSFETs [Póster]
Author/s | Tan, H.
Beltrán, Ana M. March, K. Mortet, Vincent Bedel-Pereira, Eléna Cristiano, Fuccio Strenger, C. Bauer, A.J. Schamm-Chardon, Sylvie |
Department | Universidad de Sevilla. Departamento de Ingeniería y Ciencia de los Materiales y del Transporte |
Publication Date | 2014 |
Deposit Date | 2018-02-23 |
ISBN/ISSN | 978-80-260-6720-7 |
Citation | Tan, H., Beltrán, A.M., March, K., Mortet, V., Bedel-Pereira, E., Cristiano, F.,...,Schamm-Chardon, S. (2014). MS-3-P-5702 Nanoanalytical investigations at the interface of 4H-SiC/SiO2 MOSFETs [Póster]. En 18th International Microscopy Congress (1-3), Prague (Czech Republic): Czechoslovak Microscopy Society. |
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beltran_ponencia_2014_MS-3-P.pdf | 718.4Kb | [PDF] | View/ | |