Article
On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits
Author/s | Vázquez García de la Vega, Diego
![]() ![]() ![]() ![]() ![]() ![]() ![]() Huertas Sánchez, Gloria ![]() ![]() ![]() ![]() ![]() ![]() ![]() Léger, Gildas Peralías Macías, Eduardo Rueda Rueda, Adoración Huertas Díaz, José Luis |
Department | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Publication Date | 2002 |
Deposit Date | 2018-07-10 |
Published in |
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Abstract | This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, ... This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approach |
Citation | Vázquez García de la Vega, D., Huertas Sánchez, G., Leger Leger, G., Peralías Macías, E., Rueda Rueda, A. y Huertas Díaz, J.L. (2002). On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits. Analog Integrated Circuits and Signal Processing, 33 (2), 201-211. |
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