dc.creator | Huertas Sánchez, Gloria | es |
dc.creator | Vázquez García de la Vega, Diego | es |
dc.creator | Peralías Macías, Eduardo | es |
dc.creator | Rueda Rueda, Adoración | es |
dc.creator | Huertas Díaz, José Luis | es |
dc.date.accessioned | 2018-06-18T16:32:55Z | |
dc.date.available | 2018-06-18T16:32:55Z | |
dc.date.issued | 2002 | |
dc.identifier.citation | Huertas Sánchez, G., Vázquez García de la Vega, D., Peralías Macías, E., Rueda Rueda, A. y Huertas Díaz, J.L. (2002). Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell. IEEE Design and Test of Computers, 19 (6), 73-82. | |
dc.identifier.issn | 0740-7475 | es |
dc.identifier.uri | https://hdl.handle.net/11441/76292 | |
dc.description.abstract | A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is to offer designers testing options that do not have significant area overhead, performance degradation, or test time. This work shows that OBT is a potential candidate for IP providers to use in combination with functional test techniques. We have shown how to modify the basic concept of OBT to come up with a practical method. Using our approach, designers can use OBT to pave the way for future developments in SoC testing, and it is simple to extend this idea to BIST. | es |
dc.description.sponsorship | European Union 26354 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | Institute of Electrical and Electronics Engineers | es |
dc.relation.ispartof | IEEE Design and Test of Computers, 19 (6), 73-82. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/acceptedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo | es |
dc.relation.projectID | 26354 | es |
dc.relation.publisherversion | http://dx.doi.org/10.1109/MDT.2002.1047746 | es |
dc.identifier.doi | 10.1109/MDT.2002.1047746 | es |
idus.format.extent | 10 p. | es |
dc.journaltitle | IEEE Design and Test of Computers | es |
dc.publication.volumen | 19 | es |
dc.publication.issue | 6 | es |
dc.publication.initialPage | 73 | es |
dc.publication.endPage | 82 | es |
dc.contributor.funder | European Union (UE) | |