Article
Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing
Author/s | Gandolf, Davide
Ramiro Manzano, Fernando Aparicio Rebollo, Francisco Javier Pucker, Georg Pavesi, Lorenzo |
Publication Date | 2015-02-26 |
Deposit Date | 2018-04-04 |
Published in |
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Abstract | In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon ... In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these microresonators are vertically coupled to a buried waveguide with the aim of creating integrated and cost-effective devices. Device modeling shows that the optimization of the device is a delicate balance of the resonance quality factor and evanescent field overlap with the surrounding environment to analyze. By numerical simulations, we show that the microdisk thickness is critical to yield a high figure of merit for the sensor and that edge inclination should be kept as high as possible. We also show that bulk-sensing figures of merit as high as 1600 RIU1 (refractive index unit) are feasible. |
Funding agencies | European Union (UE). FP7 |
Project ID. | FP7 EU |
Citation | Gandolf, D., Ramiro Manzano, F., Aparicio Rebollo, F.J., Pucker, G. y Pavesi, L. (2015). Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing. Sensors, 15 (3), 4796-4809. |
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