Presentation
BeTTy: Benchmarking and Testing on the Automated Analysis of Feature Models
Author/s | Segura Rueda, Sergio
Galindo Duarte, José Ángel Benavides Cuevas, David Felipe Parejo Maestre, José Antonio Ruiz Cortés, Antonio |
Department | Universidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticos |
Publication Date | 2012 |
Deposit Date | 2017-05-29 |
Published in |
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ISBN/ISSN | 978-1-4503-1058-1 |
Abstract | The automated analysis of feature models is a
ourishing research
topic that has called the attention of both researchers
and practitioners during the last two decades. During this
time, the number of tools and techniques ... The automated analysis of feature models is a ourishing research topic that has called the attention of both researchers and practitioners during the last two decades. During this time, the number of tools and techniques enabling the analysis of feature models has increased and also their complexity. In this scenario, the lack of speci c testing mechanisms to assess the correctness and good performance of analysis tools is becoming a major obstacle hindering the development of tools and a ecting their quality and reliability. In this pa-per, we present BeTTy, a framework for BEnchmarking and T esT ing on the analY sis of feature models. Among other features, BeTTy enables the automated detection of faults in feature model analysis tools. Also, it supports the gen-eration of motivating test data to evaluate the performance of analysis tools in both average and pessimistic cases. Part of the functionality of the framework is provided through a web-based interface facilitating the random generation of both classic and attributed feature models. |
Project ID. | TIN2009- 07366
TIC-2533 TIC-5906 |
Citation | Segura Rueda, S., Galindo Duarte, J.Á., Benavides Cuevas, D.F., Parejo Maestre, J.A. y Ruiz Cortés, A. (2012). BeTTy: Benchmarking and Testing on the Automated Analysis of Feature Models. En VaMoS 12: Sixth International Workshop on Variability Modeling of Software-Intensive Systems (63-71), Leipzig, Germany: ACM. |