Artículo
Influence of the yttria content on the mechanical properties of Y2O3-ZrO2 thin films prepared by EB-PVD
Autor/es | Ochando, I.M.
Cáceres, D. García López, J. Escobar-Galindo, Ramón Jiménez Rioboó, Rafael José Prieto, C. |
Departamento | Universidad de Sevilla. Departamento de Física Aplicada I |
Fecha de publicación | 2007-08-28 |
Fecha de depósito | 2023-06-29 |
Publicado en |
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Resumen | A mechanical characterization study of the whole range (ZrO2)1−x–(Y2O3)x system is presented for thin film samples. Films have been prepared by Electron Beam Physical Vapour Deposition (EB-PVD) on Si(1 0 0) substrates. The ... A mechanical characterization study of the whole range (ZrO2)1−x–(Y2O3)x system is presented for thin film samples. Films have been prepared by Electron Beam Physical Vapour Deposition (EB-PVD) on Si(1 0 0) substrates. The mechanical characterization, obtained from nanoindentation and Brillouin Light scattering (BLS) techniques, shows a monotonous behaviour between the two pure compounds of the series except for the film with 0.08 Y2O3 molar content of yttria-stabilized zirconia (YSZ) solid solution that presents an anomalous hard value. Additionally, BLS is presented as an alternative technique to the study of the mechanical properties of this system. |
Agencias financiadoras | Dirección General de Investigación Científica y Técnica (DGICYT). España |
Identificador del proyecto | MAT2003-6147-C04-01
MAT2003-6147-C04-02 |
Cita | Ochando, I.M., Cáceres, D., García López, J., Escobar-Galindo, R., Jiménez Rioboó, R.J. y Prieto, C. (2007). Influence of the yttria content on the mechanical properties of Y2O3-ZrO2 thin films prepared by EB-PVD. Vacuum, 81 (11-12), 1457-1461. https://doi.org/10.1016/j.vacuum.2007.04.028. |
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