Filtrado por: Materia
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Crack growth simulation (1) |
Critical defect SEM and confocal microscopy (1) |
Fatigue (1) |
SLM (1) |
Titanium alloy (1) |
Crack growth simulation (1) |
Critical defect SEM and confocal microscopy (1) |
Fatigue (1) |
SLM (1) |
Titanium alloy (1) |