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Listar Instituto de Microelectrónica de Sevilla (IMSE-CNM) por autor "Tan, Sheldon X.-D."
Mostrando ítems 1-2 de 2
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Artículo
Pathological element-based active device models and their application to symbolic analysis
Sánchez López, Carlos; Fernández Fernández, Francisco Vidal; Tlelo-Cuautle, E.; Tan, Sheldon X.-D. (Institute of Electrical and Electronics Engineers, 2011)This paper proposes new pathological element-based active device models which can be used in analysis tasks of linear(ized) ...
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Artículo
Symbolic analysis of analog circuits containing voltage mirrors
Tlelo-Cuautle, E.; Sánchez López, Carlos; Martínez Romero, E.; Tan, Sheldon X.-D. (Springer, 2010)The pathological elements voltage mirror (VM) and current mirror (CM) have shown advantages in analog behavioral modeling ...