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Listar por autor "Sáenz Noval, Jorge J."
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TEMAS: A Flexible Non-AI Algorithm for Metrology of Single-Core and Core-Shell Nanoparticles from TEM Images
Sáenz Noval, Jorge J.; Gómez Merchán, Rubén; Leñero Bardallo, Juan Antonio; Gontard, Lionel C. (Wiley-Blackwell, 2023)An essential application of electron microscopy is to provide feedback to tune the fabrication of nanoparticles (NPs). ...