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Listar por autor "Lungwitz, Frank"
Mostrando ítems 1-5 de 5
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Artículo
Cluster Tool for In Situ Processing and Comprehensive Characterization of Thin Films at High Temperatures
Wenisch, Robert; Lungwitz, Frank; Hanf, Daniel; Heller, René; Zscharschuch, Jens; Hübner, René; Borany, Johannes von; Abrasonis, Gintautas; Gemming, Sibylle; Escobar-Galindo, Ramón; Krause, Matthias (American Chemical Society, 2018-05-31)A new cluster tool for in situ real-time processing and depth-resolved compositional, structural and optical characterization ...
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Artículo
Design of high-temperature solar-selective coatings based on aluminium titanium oxynitrides AlyTi1-y(OxN1-x). Part 2: Experimental validation and durability tests at high temperature
Escobar-Galindo, Ramón; Guillén, E.; Heras, Irene; Rincón Llorente, G.; Alcón Camas, M.; Lungwitz, Frank; Munnik, Frans; Schumann, Erik; Azkona, Ibon; Krause, Matthias (ScienceDirect, 2018-10)The durability of two solar-selective aluminium titanium oxynitride multilayer coatings was studied under conditions ...
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Artículo
Design of high-temperature solar-selective coatings based on aluminium titanium oxynitrides AlyTi1−y(OxN1−x). Part 1: Advanced microstructural characterization and optical simulation
Heras, Irene; Guillén, E.; Lungwitz, Frank; Rincón Llorente, G.; Munnik, Frans; Schumann, Erik; Azkona, Ibon; Krause, Matthias; Escobar-Galindo, Ramón (ScienceDirect, 2018-03)Aluminium titanium oxynitrides were studied as candidate materials for high temperature absorbers in solar selective ...
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Ponencia
Room temperature deposition of highly dense TiO2 thin films by Filtered Cathodic Vacuum Arc
Guillén Guillén, Elena; Heras, Irene; Rincón Llorente, G.; Lungwitz, Frank; Alcón Camas, M.; Escobar-Galindo, Ramón (SPIE Digital Library, 2015)A systematic study of TiO2 films deposited by dc filtered cathodic vacuum arc (FCVA) was carried out by varying the ...
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Artículo
WAlSiN-based solar-selective coating stability-study under heating and cooling cycles in vacuum up to 800 °C using in situ Rutherford backscattering spectrometry and spectroscopic ellipsometry
Niranjan, K.; Krause, Matthias; Lungwitz, Frank; Munnik, Frans; Hübner, René; Pramod Pemmasani, Sai; Escobar-Galindo, Ramón; Barshilia, Harish C. (ScienceDirect, 2023-06-15)In situ Rutherford backscattering spectrometry (RBS) and spectroscopic ellipsometry (SE) were applied to study the ...