5×5 SPAD matrices for the study of the trade-offs between fill factor, dark count rate and crosstalk in the design of CMOS image sensors

Moreno García, Manuel; Río Fernández, Rocío del; Guerra Vinuesa, Oscar; Rodríguez Vázquez, Ángel Benito

doi:10.1109/PRIME.2014.6872752

Ponencia

dc.creator	Moreno García, Manuel	es
dc.creator	Río Fernández, Rocío del	es
dc.creator	Guerra Vinuesa, Oscar	es
dc.creator	Rodríguez Vázquez, Ángel Benito	es
dc.date.accessioned	2019-12-02T15:37:33Z
dc.date.available	2019-12-02T15:37:33Z
dc.date.issued	2014
dc.identifier.citation	Moreno García, M., Río Fernández, R.d., Guerra Vinuesa, O. y Rodríguez Vázquez, Á.B. (2014). 5×5 SPAD matrices for the study of the trade-offs between fill factor, dark count rate and crosstalk in the design of CMOS image sensors. En 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) Grenoble, Francia: Institute of Electrical and Electronics Engineers.
dc.identifier.isbn	978-1-4799-4994-6	es
dc.identifier.uri	https://hdl.handle.net/11441/90664
dc.description.abstract	CMOS Single Photon Avalanche Diodes (SPADs) are a dedicated type of photodetectors that are attracting increasing interest. Crosstalk and fill factor are magnitudes that become important when dealing with arrays of SPADs. There are trade-offs that involve these two magnitudes and dark count rate (DCR) which are of great interest for the implementation of image sensors. A set of 5×5 matrices of SPADs with different sizes and shapes is designed to study the relationships between FF, crosstalk and DCR, and conceive an accurate behavioural model of SPAD arrays. The testchip is fully operative and preliminary experimental results are presented.	es
dc.description.sponsorship	Office of Naval Research (USA) N000141410355	es
dc.description.sponsorship	Ministerio de Economía y Competitividad IPT-2011-1625-430000, TEC2012-38921-C02-01	es
dc.description.sponsorship	Junta de Andalucía P12-TIC-2338	es
dc.format	application/pdf	es
dc.language.iso	eng	es
dc.publisher	Institute of Electrical and Electronics Engineers	es
dc.relation.ispartof	10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) (2014),
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internacional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.title	5×5 SPAD matrices for the study of the trade-offs between fill factor, dark count rate and crosstalk in the design of CMOS image sensors	es
dc.type	info:eu-repo/semantics/conferenceObject	es
dcterms.identifier	https://ror.org/03yxnpp24
dc.type.version	info:eu-repo/semantics/acceptedVersion	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo	es
dc.relation.projectID	N000141410355	es
dc.relation.projectID	IPT-2011-1625-430000	es
dc.relation.projectID	TEC2012-38921-C02-01	es
dc.relation.projectID	P12-TIC-2338	es
dc.relation.publisherversion	https://doi.org/10.1109/PRIME.2014.6872752	es
dc.identifier.doi	10.1109/PRIME.2014.6872752	es
idus.format.extent	4 p.	es
dc.eventtitle	10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)	es
dc.eventinstitution	Grenoble, Francia	es

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