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Fine-grain circuit hardening through VHDL datatype substitution

 

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Author: Muñoz-Quijada, María
Sánchez-Barea, Samuel
Vela-Calderón, Daniel
Guzmán-Miranda, Hipólito
Department: Universidad de Sevilla. Departamento de Ingeniería Electrónica
Date: 2019-01
Published in: Electronics, 8 (1)
Document type: Article
Abstract: Radiation effects can induce, amongst other phenomena, logic errors in digital circuits and systems. These logic errors corrupt the states of the internal memory elements of the circuits and can propagate to the primary outputs, affecting other onbo...
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Cite: Muñoz-Quijada, M., Sánchez-Barea, S., Vela-Calderón, D. y Guzmán Miranda, H. (2019). Fine-grain circuit hardening through VHDL datatype substitution. Electronics, 8 (1)
Size: 555.9Kb
Format: PDF

URI: https://hdl.handle.net/11441/85475

DOI: 10.3390/electronics8010024

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