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Selection of test techniques for high-resolution ΣΔ modulators

 

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Opened Access Selection of test techniques for high-resolution ΣΔ modulators
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Author: Guerra Vinuesa, Oscar
Escalera, Sara
Rosa Utrera, José Manuel de la
Compaigne, Eric
Galliard, Christophe
Rodríguez Vázquez, Ángel Benito
Department: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Date: 2000
Published in: Conference on Design of Circuits and Integrated Systems (2000), p 211-214
ISBN/ISSN: 2-9522971-0-X
Document type: Presentation
Abstract: This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. Index Terms—ΣΔ modulators, Test Techniques.
Cite: Guerra Vinuesa, O., Escalera, S., Rosa Utrera, J.M.d.l., Compaigne, E., Galliard, C. y Rodríguez Vázquez, Á.B. (2000). Selection of test techniques for high-resolution ΣΔ modulators. En Conference on Design of Circuits and Integrated Systems, Bordeaux (Francia).
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Format: PDF

URI: https://hdl.handle.net/11441/79997

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