Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators

Léger, Gildas; Rueda Rueda, Adoración

doi:10.1049/ip-cds:20040558(410)%20151

Artículo

dc.creator	Léger, Gildas	es
dc.creator	Rueda Rueda, Adoración	es
dc.date.accessioned	2018-07-10T14:34:07Z
dc.date.available	2018-07-10T14:34:07Z
dc.date.issued	2004
dc.identifier.citation	Léger, G. y Rueda Rueda, A. (2004). Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators. IEE Proceedings Circuits, Devices and Systems, 151 (4), 349-358.
dc.identifier.issn	1350-2409	es
dc.identifier.uri	https://hdl.handle.net/11441/77103
dc.description.abstract	This paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator leakage is known to be related to the converter precision and belongs to the basic set of design specifications. The technique proposed here involves very few hardware, which makes it specially suitable for Built-In Self-Test (BIST) implementation. Moreover, the integrator leakage evaluation allows its digital correction in cascaded modulators.	es
dc.format	application/pdf	es
dc.language.iso	eng	es
dc.publisher	Institute of Electrical and Electronics Engineers	es
dc.relation.ispartof	IEE Proceedings Circuits, Devices and Systems, 151 (4), 349-358.
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internacional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.subject	ΣΔ modulators	es
dc.subject	Testability	es
dc.subject	BIST	es
dc.title	Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators	es
dc.type	info:eu-repo/semantics/article	es
dcterms.identifier	https://ror.org/03yxnpp24
dc.type.version	info:eu-repo/semantics/acceptedVersion	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo	es
dc.relation.publisherversion	http://dx.doi.org/10.1049/ip-cds:20040558(410)%20151	es
dc.identifier.doi	10.1049/ip-cds:20040558(410)%20151	es
idus.format.extent	12 p.	es
dc.journaltitle	IEE Proceedings Circuits, Devices and Systems	es
dc.publication.volumen	151	es
dc.publication.issue	4	es
dc.publication.initialPage	349	es
dc.publication.endPage	358	es

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